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Proceedings Paper

Foci determination of an off-axis ellipsoid: from theory to practice
Author(s): Yvette Houbrechts; Steve Roose; Yvan Stockman
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Paper Abstract

In the frame of cryogenic test on an off axis ellipsoid, it has been required to set-up an unambiguous method to determine and track the foci position during temperature transitions. This procedure was mandatory to avoid: (1) impact of the operator skills working on triple shift scheme to assure continuously monitoring of the ellipsoid shape during cool down. (2) correctly dissociate the impact of the thermal deformation on the mirror shape with respect to alignment errors. This paper will demonstrate the process, starting from ideal ellipsoid shape, then introducing 3D metrology data in a model, and finally presents the results in a practical situation.

Paper Details

Date Published: 2 August 2004
PDF: 12 pages
Proc. SPIE 5532, Interferometry XII: Applications, (2 August 2004); doi: 10.1117/12.560734
Show Author Affiliations
Yvette Houbrechts, Univ. de Liege (Belgium)
Steve Roose, Univ. de Liege (Belgium)
Yvan Stockman, Univ. de Liege (Belgium)

Published in SPIE Proceedings Vol. 5532:
Interferometry XII: Applications
Wolfgang Osten; Erik Novak, Editor(s)

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