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Proceedings Paper

Recent advances in measurements of permittivity and dielectric losses at microwave frequencies
Author(s): Jerzy Krupka; Janina E. Mazierska; Mohan V. Jacob; John G. Hartnett; Michael E. Tobar
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Paper Abstract

The precise microwave characterization of dielectric materials is an important issue for emerging technologies of the 21st century. In this paper recent advances in resonant techniques for permittivity and dielectric loss tangent measurements of low and medium loss dielectrics at microwave frequencies are presented.

Paper Details

Date Published: 7 April 2004
PDF: 7 pages
Proc. SPIE 5445, Microwave and Optical Technology 2003, (7 April 2004); doi: 10.1117/12.560676
Show Author Affiliations
Jerzy Krupka, Warsaw Univ. of Technology (Poland)
Janina E. Mazierska, James Cook Univ. (Australia)
Mohan V. Jacob, James Cook Univ. (Australia)
John G. Hartnett, Univ. of Western Australia (Australia)
Michael E. Tobar, Univ. of Western Australia (Australia)

Published in SPIE Proceedings Vol. 5445:
Microwave and Optical Technology 2003
Jaromir Pistora; Kamil Postava; Miroslav Hrabovsky; Banmali S. Rawat, Editor(s)

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