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Proceedings Paper

Calculation of x-ray refraction from near-edge absorption data only
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Paper Abstract

Near-edge x-ray absorption resonances provide information on molecular orbital structure; these resonances can be exploited in x-ray spectromicroscopy to give sub-50-nanometer resolution images with chemical state sensitivity. At the same time, radiation damage sets a limit to the resolution that can be obtained in absorption mode. Phase contrast imaging may provide another means of chemical state imaging with lower radiation dose. We describe here the use of experimentally measured near-edge absorption data to estimate near-edge phase resonances. This is accomplished by splicing the near-edge data into reference data and carrying out a numerical integration of the Kramers-Kronig relation.

Paper Details

Date Published: 14 October 2004
PDF: 8 pages
Proc. SPIE 5538, Optical Constants of Materials for UV to X-Ray Wavelengths, (14 October 2004); doi: 10.1117/12.560160
Show Author Affiliations
Chris J. Jacobsen, Stony Brook Univ. (United States)
Steve Yuxin Wang, Xradia, Inc. (United States)
Wenbing Yun, Xradia, Inc. (United States)
Sean Frigo, Northern Arizona Univ. (United States)

Published in SPIE Proceedings Vol. 5538:
Optical Constants of Materials for UV to X-Ray Wavelengths
Regina Soufli; John F. Seely, Editor(s)

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