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Proceedings Paper

Time-frequency analysis using peak-value sampling of spatial-temporal image data from streak camera
Author(s): Ke-Xun Sun; Kent Marlett
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Paper Abstract

A streak camera is a recording instrument in which spatial image is swept in time, creating a spatial-temporal image on a charge-coupled device (CCD). Traditional analysis for captured image data has been using uniform grid as sampling points, in which a block of CCD pixel readouts are summed to give one reading. Equivalently simple area moving averages are applied concurrently while sampling, and high frequency content is reduced. To solve this problem, we use peak-value sampling procedure, based on the view from photoelectron statistics. After background correction, maximum values in spatial dimensions are selected to obtain time series data. A DSP filter is then applied and optimized for this time series. A Welch algorithm fast Fourier transform is applied to obtain power spectra. Segmented cumulative spectra is then calculated for global statistics and related to time domain fluctuations. Self similarity at different sweeping time-scales is used to recognize CCD pattern noise. Sinusoidal pattern noise is automatically corrected by peak-value sampling. Computational results show that time-frequency analysis using peak-value sampling algorithm and similar variants is far more effective in discovering high frequency oscillatory noise than traditional uniform binned sampling. We have applied this algorithm to analyze data produced by a 4096x4096 CCD streak camera illuminated with a macro pulse laser. High frequency oscillations in 6~10 GHz region were found in laser spectra. Spatial-temporal oscillations of this range are difficult to diagnose with conventional optoelectronic detectors on a per-shot basis. This work has led to improvement of laser design.

Paper Details

Date Published: 26 October 2004
PDF: 12 pages
Proc. SPIE 5559, Advanced Signal Processing Algorithms, Architectures, and Implementations XIV, (26 October 2004); doi: 10.1117/12.560070
Show Author Affiliations
Ke-Xun Sun, Bechtel Nevada (United States)
Kent Marlett, Bechtel Nevada (United States)

Published in SPIE Proceedings Vol. 5559:
Advanced Signal Processing Algorithms, Architectures, and Implementations XIV
Franklin T. Luk, Editor(s)

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