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Proceedings Paper

Three-beam x-ray diffraction in crystals with thin strain layers
Author(s): M. D. Borcha; O. S. Kshevetsky; V. M. Tkach
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Paper Abstract

By a numerical solution of the system of Takagi differential equations, the influence of a thin subsurface strained layer and a system of equal strained layers on three-beam diffraction effects of X-ray scattering in A3B5 compounds and diamond crystals have been investigated. It is established that the degree of suppression or enhancement of three-beam anomalous transmission significantly depends on the influence of the parameters of the strained layer on various effects typical for each multiple configuration, as well as on the structural features of the crystals being considered.

Paper Details

Date Published: 4 June 2004
PDF: 9 pages
Proc. SPIE 5477, Sixth International Conference on Correlation Optics, (4 June 2004); doi: 10.1117/12.559870
Show Author Affiliations
M. D. Borcha, Chernivtsi National Univ. (Ukraine)
O. S. Kshevetsky, Institute of Thermoelectricity (Ukraine)
V. M. Tkach, Institute of Superhard Materials (Ukraine)

Published in SPIE Proceedings Vol. 5477:
Sixth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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