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Proceedings Paper

Acceptance testing of a large-aperture dynamic wavefront sensor
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Paper Abstract

A large aperture dynamic wavefront sensor (WFS) was tested and qualified for use against its design requirements. The WFS was designed to measure the relative slope of dynamic wavefronts; therefore, the test system created dynamic wavefronts, moving at 35 Hz to 315 Hz, with slopes on the order of 50 nanoradians (nR). The essential test system was an f/2.3 parabolic mirror with a laser source at the focal point, offset laterally by a fold mirror. The reflected light was nominally collimated and incident on the WFS at zero degrees. The source hardware was mounted on two crossed-translation stages that could drive a 540 μm, 1/2 Hz trapezoidal motion, inducing tilt in the collimated beam. This 100 microradians (μR) wavefront modulation calibrated the WFS. The fold mirror was mounted on a PZT, which oscillated the fold mirror from 35 Hz to 315 Hz, at tilt angles near 10 μR. This tilt moved the virtual source point, inducing wavefront tilts in the collimated output beam on the order of 100 nR. These fast, very small wavefront tilts were used to test the WFS performance. The test system, procedure, and calibration procedures are described.

Paper Details

Date Published: 12 October 2004
PDF: 10 pages
Proc. SPIE 5553, Advanced Wavefront Control: Methods, Devices, and Applications II, (12 October 2004); doi: 10.1117/12.559869
Show Author Affiliations
David J. Fischer, Eastman Kodak Co. (United States)
Alan Wertheimer, Eastman Kodak Co. (United States)
Laurie Hill, Eastman Kodak Co. (United States)

Published in SPIE Proceedings Vol. 5553:
Advanced Wavefront Control: Methods, Devices, and Applications II
John D. Gonglewski; Mark T. Gruneisen; Michael K. Giles, Editor(s)

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