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Proceedings Paper

Optical correlation diagnostics of rough surfaces: statistical and fractal approach
Author(s): Oleg V. Angelsky; Peter P. Maksimyak; Dimitry N. Burcovets; I. M. Grigiraschuk
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Paper Abstract

New feasibilities are considered for optical correlation diagnostics of rough surfaces with different distributions of irregularities. The influence of deviations of the height surface roughness distribution from a Gaussian probability distribution on the accuracy of optical analysis is discussed. The possibilities for optical diagnostics of fractal surface structures are shown and the set of statistical and dimensional parameters of the scattered fields for surface roughness diagnostics is determined. Fast operating measuring devices for roughness control are proposed.

Paper Details

Date Published: 4 June 2004
PDF: 17 pages
Proc. SPIE 5477, Sixth International Conference on Correlation Optics, (4 June 2004); doi: 10.1117/12.559766
Show Author Affiliations
Oleg V. Angelsky, Chernivtsi National Univ. (Ukraine)
Peter P. Maksimyak, Chernivtsi National Univ. (Ukraine)
Dimitry N. Burcovets, Chernivtsi National Univ. (Ukraine)
I. M. Grigiraschuk, Chernivtsi National Univ. (Ukraine)

Published in SPIE Proceedings Vol. 5477:
Sixth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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