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Proceedings Paper

Comparison of conventional and synchrotron-radiation-based microtomography of bone around dental implants
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Paper Abstract

This study explores the application of conventional micro tomography (μCT) and synchrotron radiation (SR) based μCT to evaluate the bone around titanium dental implants. The SR experiment was performed at beamline W2 of HASYLAB at DESY using a monochromatic X-ray beam of 50 keV. The testing material consisted of undecalcified bone segments harvested from the upper jaw of a macaca fascicularis monkey each containing a titanium dental implant. The results from the two different techniques were qualitatively compared with conventional histological sections examined under light microscopy. The SR-based μCT produced images that, especially at the bone-implant interface, are less noisy and sharper than the ones obtained with conventional μCT. For the proper evaluation of the implant-bone interface, only the SR-based μCT technique is able to display the areas of bony contact and visualize the true 3D structure of bone around dental implants correctly. This investigation shows that both conventional and SR-based μCT scanning techniques are non-destructive methods, which provide detailed images of bone. However with SR-based μCT it is possible to obtain an improved image quality of the bone surrounding dental implants, which display a level of detail comparable to histological sections. Therefore, SR-based μCT scanning could represent a valid, unbiased three-dimensional alternative to evaluate osseointegration of dental implants.

Paper Details

Date Published: 26 October 2004
PDF: 8 pages
Proc. SPIE 5535, Developments in X-Ray Tomography IV, (26 October 2004); doi: 10.1117/12.559630
Show Author Affiliations
Paolo M. Cattaneo, Aarhus Univ. (Denmark)
Michel Dalstra, Aarhus Univ. (Denmark)
Felix Beckmann, GKSS-Forschungszentrum Geesthacht (Germany)
Tilman Donath, GKSS-Forschungszentrum Geesthacht (Germany)
Birte Melsen, Aarhus Univ. (Denmark)

Published in SPIE Proceedings Vol. 5535:
Developments in X-Ray Tomography IV
Ulrich Bonse, Editor(s)

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