Proceedings Paper
Statistical property of the complex analytic signal of white-light speckle pattern applied to microdisplacement measurement| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
Under the assumption of Gaussian random process, we discuss the first and the second order statistical properties of the complex amplitude of analytic signal of the white-light speckle pattern. We derive the autocorrelation function of the pseudo phase. Based on these results, we show mathematically that the proposed signal domain phase-only correlation (SD-POC) has advantage over the conventional intensity-based correlation techniques in its performance of micro-displacement measurement. We also present experimental results that support the theory.
Paper Details
Date Published: 2 August 2004
PDF: 7 pages
Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, (2 August 2004); doi: 10.1117/12.559118
Published in SPIE Proceedings Vol. 5531:
Interferometry XII: Techniques and Analysis
Katherine Creath; Joanna Schmit, Editor(s)
PDF: 7 pages
Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, (2 August 2004); doi: 10.1117/12.559118
Show Author Affiliations
Wei Wang, Univ. of Electro-Communications (Japan)
Nobuo Ishii, Univ. of Electro-Communications (Japan)
Nobuo Ishii, Univ. of Electro-Communications (Japan)
Yoko Miyamoto, Univ. of Electro-Communications (Japan)
Mitsuo Takeda, Univ. of Electro-Communications (Japan)
Mitsuo Takeda, Univ. of Electro-Communications (Japan)
Published in SPIE Proceedings Vol. 5531:
Interferometry XII: Techniques and Analysis
Katherine Creath; Joanna Schmit, Editor(s)
© SPIE. Terms of Use
