Share Email Print
cover

Proceedings Paper

Instantaneous phase-shift point-diffraction interferometer
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We demonstrate an instantaneous phase-shift, point diffraction interferometer that achieves high accuracy and is capable of measuring a single pulse of light at NA greater than 0.8.

Paper Details

Date Published: 9 September 2004
PDF: 8 pages
Proc. SPIE 5380, Optical Data Storage 2004, (9 September 2004); doi: 10.1117/12.557126
Show Author Affiliations
James E. Millerd, 4D Technology Corp. (United States)
Stephen J. Martinek, 4D Technology Corp. (United States)
Neal J. Brock, 4D Technology Corp. (United States)
John B. Hayes, 4D Technology Corp. (United States)
James C. Wyant, 4D Technology Corp. (United States)


Published in SPIE Proceedings Vol. 5380:
Optical Data Storage 2004
B. V. K. Vijaya Kumar; Hiromichi Kobori, Editor(s)

© SPIE. Terms of Use
Back to Top