
Proceedings Paper
Massively parallel interferometry: towards the all-integrated lambdameterFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper we present recent work about the application of
digital phase detection for accurate wavelength measurement using
two beam interferometry (lambdametry). The advantage of two beam
interferometry is the sinusoidal fringe signal for which precise
phase detection algorithms exist. Modern algorithms can cope with
different sources of errors, and correct them. We recall the
principle of the Michelson-type lambdameter using temporal
interference and we introduce the Young-type lambdameter using
spatial interference. The Young-type lambdameter is based on the
acquisition of the interference pattern from two point sources
(e.g. two ends of monomode optical fibers) projected onto a CCD
camera. The measurement of an unknown wavelength can be achieved
by comparison with a reference wavelength. Accurate interference
phase maps can be calculated using spatial phase-shifting. In this
way, each small group of contiguous pixels acts as a single
interferometer, and the whole set of pixels corresponds to a
massively parallel interferometric measurement system (up to many
hundreds of thousands units). The major advantage of our method is
its structural simplicity and the possibility of full optical
integration.
The final goal is to achieve a relative uncertainty of the order of
some 10-8 with a measurement duration of the order of some
minutes. Preliminary results are presented.
Paper Details
Date Published: 2 August 2004
PDF: 12 pages
Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, (2 August 2004); doi: 10.1117/12.556325
Published in SPIE Proceedings Vol. 5531:
Interferometry XII: Techniques and Analysis
Katherine Creath; Joanna Schmit, Editor(s)
PDF: 12 pages
Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, (2 August 2004); doi: 10.1117/12.556325
Show Author Affiliations
Yves Surrel, Conservatoire National des Arts et Metiers (France)
Published in SPIE Proceedings Vol. 5531:
Interferometry XII: Techniques and Analysis
Katherine Creath; Joanna Schmit, Editor(s)
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