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Proceedings Paper

FEL beam metrology with a gas-monitor detector
Author(s): Alexander Gottwald; SergeJ V. Bobashev; Ulrich Hahn; Arne Hoehl; Ulf Jastrow; Mathias Richter; Andrej A. Sorokin; Kai I. Tiedtke
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Paper Abstract

For the determination of absolute photon fluxes from high-intense, pulsed VUV and soft X-ray sources like free-electron lasers, a gas-monitor detector system based on the photoionization of rare gases was developed. A prototype system was successfully used for the characterization of VUV free-electron laser radiation at the TESLA test facility (phase 1) in Hamburg. Pulse-resolved measurements at peak powers of more than 100 MW at a wavelength of 87 nm were demonstrated. In order to provide a photon-beam diagnostic of VUV-FEL radiation during phase 2 of the TTF project, a set of four new detectors has been constructed, based on the prototype. The new detector system can be used not only for intensity measurement and monitoring, but also for measuring the beam position. The detector set was calibrated in the Radiometry Laboratory of the Physikalisch-Technische Bundesanstalt at the electron storage ring BESSY II. The calibration was performed using spectrally-dispersed synchrotron radiation at low intensities and a semiconductor photodiode as a transfer standard.

Paper Details

Date Published: 10 November 2004
PDF: 9 pages
Proc. SPIE 5534, Fourth Generation X-Ray Sources and Optics II, (10 November 2004); doi: 10.1117/12.556289
Show Author Affiliations
Alexander Gottwald, Physikalisch-Technische Bundesanstalt (Germany)
SergeJ V. Bobashev, A.F. Ioffe Physico-Technical Institute (Russia)
Ulrich Hahn, DESY (Germany)
Arne Hoehl, Physikalisch-Technische Bundesanstalt (Germany)
Ulf Jastrow, DESY (Germany)
Mathias Richter, Physikalisch-Technische Bundesanstalt (Germany)
Andrej A. Sorokin, Physikalisch-Technische Bundesanstalt (Germany)
Kai I. Tiedtke, DESY (Germany)

Published in SPIE Proceedings Vol. 5534:
Fourth Generation X-Ray Sources and Optics II
Sandra G. Biedron; Wolfgang Eberhardt; Tetsuya Ishikawa; Roman O. Tatchyn, Editor(s)

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