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Proceedings Paper

Double-channel crystal spectrograph for measuring plasma x-ray in the 1.33–2.46-nm region
Author(s): Xiancai Xiong; Xianxin Zhong; Shali Xiao; Yu Chen; Guohong Yang; Jie Gao
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Paper Abstract

In order to measure laser-produced plasma x-ray in the 1.33-2.46-nm region, an elliptical crystal spectrograph has been designed and fabricated. The potassium acid phthalate (KAP) crystal with a 2d spacing of 2.663 nm is used as the x-ray dispersive element, it is elliptically bent and glued on a rustless-steel substrate with a 0.9586 eccentricity and a 1350-mm focal distance. The spectrograph is equipped with an x-ray charge-coupled device (CCD) camera for recording the space-resolved spectrum on one port, and an x-ray streak camera for recording the time-resolved spectrum on another port. The first testing experiment was carried out on the XG-2 target chamber, the experimental results demonstrate that the spectral resolution is about 640 for this spectrograph.

Paper Details

Date Published: 22 October 2004
PDF: 7 pages
Proc. SPIE 5524, Novel Optical Systems Design and Optimization VII, (22 October 2004); doi: 10.1117/12.555653
Show Author Affiliations
Xiancai Xiong, Chongqing Univ. (China)
Xianxin Zhong, Chongqing Univ. (China)
Shali Xiao, Chongqing Univ. (China)
Yu Chen, Univ. of Southern California (United States)
Guohong Yang, China Academy of Engineering Physics (China)
Jie Gao, Chongqing Univ. (China)

Published in SPIE Proceedings Vol. 5524:
Novel Optical Systems Design and Optimization VII
Jose M. Sasian; R. John Koshel; Paul K. Manhart; Richard C. Juergens, Editor(s)

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