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Proceedings Paper

Instantaneous phase-shifted speckle interferometer for measurement of large optical structures
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Paper Abstract

Digital Speckle Pattern Interferometry (DSPI) is a well-established method for the measurement of diffuse objects in experimental mechanics. DSPIs are phase shifting interferometers. Three or four bucket temporal phase shifting algorithms are commonly used to provide phase shifting. These algorithms are sensitive to vibrations and can not be used to measure large optical structures far away from the interferometer. In this research a simultaneous phase shifted interferometer, PhaseCam product of 4D Technology Corporation in Tucson Arizona, is modified to be a Simultaneous phase shifted Digital Speckle Pattern Interferometer (SDSPI). Repeatability, dynamic range, and accuracy of the SDSPI are characterized by measuring a 5 cm x 5 cm carbon fiber coupon.

Paper Details

Date Published: 24 September 2004
PDF: 11 pages
Proc. SPIE 5494, Optical Fabrication, Metrology, and Material Advancements for Telescopes, (24 September 2004); doi: 10.1117/12.550847
Show Author Affiliations
Babak N. Saif, Space Telescope Science Institute (United States)
James Millerd, 4D Technology (United States)
Ritva Keski-Kuha, NASA Goddard Space Flight Ctr. (United States)
Lee Feinberg, NASA Goddard Space Flight Ctr. (United States)
James C. Wyant, Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 5494:
Optical Fabrication, Metrology, and Material Advancements for Telescopes
Eli Atad-Ettedgui; Philippe Dierickx, Editor(s)

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