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Proceedings Paper

Computer modeling of an electric controlled avalanche O21Δ generator plasma
Author(s): Alan E. Hill
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Paper Abstract

In 1995 Professor Anatoly Napartovich of the Triniti Institute in Troisk, Russia developed a powerful computer code specifically tailored to study the electric, controlled-avalanche, ionized, refrigerated O21Δ generator developed by Plasmatronics. An enormous kinetics rate equation solver was coupled to a Boltzmann electron-energy solver. Both regimes of the process -- the over-volted E/N ionization pulses and the continuous, low E/N excitation field -- were analyzed, but were not time-integrated over a string of successive controlled avalanche pulses. Professor Lowell Morgan of Kinema Research Corporation has prepared a very similar code, except that it tracks the development of O21Δ continuously over time, starting with the first controlled avalanche pulse, then through the DC excitation phase, and continuing unitl the gas exits from the generator. Both ionization and excitation phases are separately programmed to track E/N and current density in an alternating fashion, where each new segment begins with the initial conditions established by the earlier segment. So now it is possible to test any combination of specified parameters and track all processes over time, wherein a fully developed solution for all gas-species emerges as these exit the generator. This latest Morgan Code has significantly contributed to the development of an electric O21Δ generator. A number of calculations that address specific issues of particular interest will be presented. Finally, similarities and differences between the Napartovich and Morgan codes will be identified.

Paper Details

Date Published: 20 September 2004
PDF: 12 pages
Proc. SPIE 5448, High-Power Laser Ablation V, (20 September 2004); doi: 10.1117/12.548817
Show Author Affiliations
Alan E. Hill, Texas A&M Univ. (United States)
Plasmatronics, Inc. (United States)

Published in SPIE Proceedings Vol. 5448:
High-Power Laser Ablation V
Claude R. Phipps, Editor(s)

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