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Proceedings Paper

Super-dynamic-range image processing system using a new structure CCD
Author(s): Naoki Kubo; Kazuhiko Takemura; Kaoru Adachi; Toru Nishimura; Hiroshi Tamayama; Kazuki Iwabe; Tetsuo Yamada
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Paper Abstract

Recently the digital still camera (DSC) has achieved remarkable progress especially in terms of pixel numbers, and 3 mega-pixel cameras have become the main stream. This is owing to the progress of semi-conductor processing technology and DSC market demand. On the other hand, there are some problems accompanying increase of pixel numbers, for example degradation of S/N and increase of shooting interval. For the product described here we have applied miniaturization processing technology to incresing the dynamic range and have developed a Super Dynamic Range Image Processing System using a new structure CCD, in which a pair of different-type photodiodes is arranged under a micro lens that is located on the top surface. This makes it possible to capture a high contrast scene in which dynamic range is about 400%, and we have achieved distinct images of difficult scenes for a DSC to reproduce such as backlight scenes, short range stroke light photography, etc. Here, we explain the new CCD and LSIs which realize the super dynamic image processing system, and its algorithm.

Paper Details

Date Published: 7 June 2004
PDF: 8 pages
Proc. SPIE 5301, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications V, (7 June 2004); doi: 10.1117/12.547143
Show Author Affiliations
Naoki Kubo, Fuji Photo Film Co., Ltd. (Japan)
Kazuhiko Takemura, Fuji Photo Film Co., Ltd. (Japan)
Kaoru Adachi, Fuji Photo Film Co., Ltd. (Japan)
Toru Nishimura, Fuji Photo Film Co., Ltd. (Japan)
Hiroshi Tamayama, Fuji Photo Film Co., Ltd. (Japan)
Kazuki Iwabe, Fuji Photo Film Co., Ltd. (Japan)
Tetsuo Yamada, Fujifilm Microdevices Co., Ltd. (Japan)

Published in SPIE Proceedings Vol. 5301:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications V
Nitin Sampat; Morley M. Blouke; Ricardo J. Motta, Editor(s)

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