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Proceedings Paper

Coherent tools for physical-based simulation and characterization of noise in semiconductor devices oriented to nonlinear microwave circuit CAD
Author(s): Zoheir Riah; Raphael Sommet; Jean Christophe Nallatamby; Michel Prigent; Juan Obregon
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Paper Abstract

We present in this paper a set of coherent tools for noise characterization and physics-based analysis of noise in semiconductor devices. This noise toolbox relies on a low frequency noise measurement setup with special high current capabilities thanks to an accurate and original calibration. It relies also on a simulation tool based on the drift diffusion equations and the linear perturbation theory, associated with the Green's function technique. This physics-based noise simulator has been implemented successfully in the Scilab environment and is specifically dedicated to HBTs. Some results are given and compared to those existing in the literature.

Paper Details

Date Published: 25 May 2004
PDF: 12 pages
Proc. SPIE 5470, Noise in Devices and Circuits II, (25 May 2004); doi: 10.1117/12.546513
Show Author Affiliations
Zoheir Riah, Univ. de Limoges (France)
Raphael Sommet, Univ. de Limoges (France)
Jean Christophe Nallatamby, Univ. de Limoges (France)
Michel Prigent, Univ. de Limoges (France)
Juan Obregon, Univ. de Limoges (France)

Published in SPIE Proceedings Vol. 5470:
Noise in Devices and Circuits II
Francois Danneville; Fabrizio Bonani; M. Jamal Deen; Michael E. Levinshtein, Editor(s)

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