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Proceedings Paper

Correction of aberrations in an optical correlator by using it as a point diffraction interferometer
Author(s): Claudio Iemmi; Alfonso Moreno; Josep Nicolas; Juan Campos
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Paper Abstract

In VanderLugt type correlators, the input scene and the filter could be implemented onto twisted liquid crystal displays (LCD's). The modulator used to display the scene and the elements placed before the filter usually introduce phase aberrations. These aberrations have an important influence in the final correlation plane. We propose a new method to evaluate and correct in situ these aberrations by using the correlator as a point diffraction interferometer. In this work, the wave front phase distribution evaluation is performed by means of the phase shift interferometry (PSI) technique. We present the theory on which the method is based and the experimental results obtained by applying it in a convergent correlator.

Paper Details

Date Published: 10 September 2004
PDF: 9 pages
Proc. SPIE 5457, Optical Metrology in Production Engineering, (10 September 2004); doi: 10.1117/12.545753
Show Author Affiliations
Claudio Iemmi, Univ. de Buenos Aires (Argentina)
Alfonso Moreno, Univ. Autonoma de Barcelona (Spain)
Josep Nicolas, Univ. Autonoma de Barcelona (Spain)
Juan Campos, Univ. Autonoma de Barcelona (Spain)

Published in SPIE Proceedings Vol. 5457:
Optical Metrology in Production Engineering
Wolfgang Osten; Mitsuo Takeda, Editor(s)

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