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Proceedings Paper

Estimation of lifetime distributions on 1550-nm DFB laser diodes using Monte-Carlo statistic computations
Author(s): Yannick Deshayes; Frederic Verdier; Laurent Bechou; Bernard Tregon; Yves Danto; Dominique Laffitte; Jean Luc Goudard
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Paper Abstract

High performance and high reliability are two of the most important goals driving the penetration of optical transmission into telecommunication systems ranging from 880 nm to 1550 nm. Lifetime prediction defined as the time at which a parameter reaches its maximum acceptable shirt still stays the main result in terms of reliability estimation for a technology. For optoelectronic emissive components, selection tests and life testing are specifically used for reliability evaluation according to Telcordia GR-468 CORE requirements. This approach is based on extrapolation of degradation laws, based on physics of failure and electrical or optical parameters, allowing both strong test time reduction and long-term reliability prediction. Unfortunately, in the case of mature technology, there is a growing complexity to calculate average lifetime and failure rates (FITs) using ageing tests in particular due to extremely low failure rates. For present laser diode technologies, time to failure tend to be 106 hours aged under typical conditions (Popt=10 mW and T=80°C). These ageing tests must be performed on more than 100 components aged during 10000 hours mixing different temperatures and drive current conditions conducting to acceleration factors above 300-400. These conditions are high-cost, time consuming and cannot give a complete distribution of times to failure. A new approach consists in use statistic computations to extrapolate lifetime distribution and failure rates in operating conditions from physical parameters of experimental degradation laws. In this paper, Distributed Feedback single mode laser diodes (DFB-LD) used for 1550 nm telecommunication network working at 2.5 Gbit/s transfer rate are studied. Electrical and optical parameters have been measured before and after ageing tests, performed at constant current, according to Telcordia GR-468 requirements. Cumulative failure rates and lifetime distributions are computed using statistic calculations and equations of drift mechanisms versus time fitted from experimental measurements.

Paper Details

Date Published: 10 September 2004
PDF: 13 pages
Proc. SPIE 5465, Reliability of Optical Fiber Components, Devices, Systems, and Networks II, (10 September 2004); doi: 10.1117/12.545737
Show Author Affiliations
Yannick Deshayes, IXL Lab., CNRS and Univ. Bordeaux 1 (France)
Frederic Verdier, IXL Lab., CNRS and Univ. Bordeaux 1 (France)
Laurent Bechou, IXL Lab., CNRS and Univ. Bordeaux 1 (France)
Bernard Tregon, IXL Lab., CNRS and Univ. Bordeaux 1 (France)
Yves Danto, IXL Lab., CNRS and Univ. Bordeaux 1 (France)
Dominique Laffitte, AVANEX (France)
Jean Luc Goudard, AVANEX (France)

Published in SPIE Proceedings Vol. 5465:
Reliability of Optical Fiber Components, Devices, Systems, and Networks II
Hans G. Limberger; M. John Matthewson, Editor(s)

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