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Proceedings Paper

Scattering of light by sound on a nanoscale
Author(s): Adnen Mlayah; Jesse Groenen; Guillaume Bachelier; Fanny Poinsotte; Jean Roch Huntzinger; Maximilien Cazayous; Elena Bedel-Pereira; Alexandre Arnoult; Oliver G Schmidt; Nicolas Bertru; Cyrill Paranthoen; Olivier Dehaese
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Paper Abstract

We report on light scattering experiments (Raman-Brillouin) in semiconductor quantum wells and quantum dots nanostructures. All measurements were performed under resonant excitation of the optical transitions involving confined electronic states. The scattered light was detected in the very low-frequency range around the Rayleigh line. We observe strong oscillations of the scattered intensity. Their period and relative amplitudes depend on the sample characteristics (size, density and spatial distribution of nano-objects). We show that such signal originates from interference effects due to the interaction between sound waves and the excited electronic density. By comparing simulated and measured spectra, we are able to extract, from the experiments, sample characteristics such as average size and size distribution of quantum dots. This optical sensing technique, namely Raman interferometry, is similar to the well-known X-ray diffraction technique, in the sense that it allows imaging of electronic states in the reciprocal space. Moreover, we show that Raman interferometry is a surface sensitive technique. By using quantum dots and quantum wells as Thz acoustic-detectors we are able to measure the reflection of sound waves at the sample surface. The surface characteristics (nano-scale roughness and oxidation) can be addressed using this method.

Paper Details

Date Published: 1 September 2004
PDF: 8 pages
Proc. SPIE 5459, Optical Sensing, (1 September 2004); doi: 10.1117/12.545503
Show Author Affiliations
Adnen Mlayah, LPS (France)
Jesse Groenen, LPS (France)
Guillaume Bachelier, LPS (France)
Fanny Poinsotte, LPS (France)
Jean Roch Huntzinger, LPS (France)
Maximilien Cazayous, LPS (France)
Elena Bedel-Pereira, LAAS (France)
Alexandre Arnoult, LAAS (France)
Oliver G Schmidt, Max-Planck-Institut fur Festkoerperforschung (Germany)
Nicolas Bertru, Institut National des Sciences Appliquees de Renne (France)
Cyrill Paranthoen, Institut National des Sciences Appliquees de Renne (France)
Olivier Dehaese, Institut National des Sciences Appliquees de Renne (France)

Published in SPIE Proceedings Vol. 5459:
Optical Sensing
Brian Culshaw; Anna Grazia Mignani; Rainer Riesenberg, Editor(s)

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