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Proceedings Paper

Incorporation of measured natural reflectivities in a background clutter simulation
Author(s): Albert D. Sheffer Jr.; J. Michael Cathcart; Steven R. Hahn; Simeon D. Harbert
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Paper Abstract

Modeling of material reflectance in simulated infrared/electro-optical scenes is typically done assuming a Gaussian distribution or similar simple statistical model, because of limited available measured data. Such an approach fails to capture the true reflectance statistics for active systems such as laser sensors. A new approach developed for a data-rich environment will be described, as applied to a laser sensor simulation. This approach utilizes a large database of recently collected laser sensor data to derive reflectance histograms for each material type in a scene. Simulated imagery using such sampled histograms is much more faithful to actual system imagery than that based on traditional statistical models. The paper will describe the material database and the algorithms by which it is utilized in the simulation, and will present resulting simulated imagery and comparisons to simulated imagery using Gaussian reflectivity models.

Paper Details

Date Published: 5 August 2004
PDF: 10 pages
Proc. SPIE 5431, Targets and Backgrounds X: Characterization and Representation, (5 August 2004); doi: 10.1117/12.542771
Show Author Affiliations
Albert D. Sheffer Jr., Georgia Institute of Technology (United States)
J. Michael Cathcart, Georgia Institute of Technology (United States)
Steven R. Hahn, Georgia Institute of Technology (United States)
Simeon D. Harbert, Georgia Institute of Technology (United States)

Published in SPIE Proceedings Vol. 5431:
Targets and Backgrounds X: Characterization and Representation
Wendell R. Watkins; Dieter Clement; William R. Reynolds, Editor(s)

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