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Proceedings Paper

Advanced Video Guidance Sensor (AVGS) development testing
Author(s): Richard T. Howard; Albert S. Johnston; Thomas C. Bryan; Michael L. Book
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Paper Abstract

NASA's Marshall Space Flight Center was the driving force behind the development of the Advanced Video Guidance Sensor, an active sensor system that provides near-range sensor data as part of an automatic rendezvous and docking system. The sensor determines the relative positions and attitudes between the active sensor and the passive target at ranges up to 300 meters. The AVGS uses laser diodes to illuminate retro-reflectors in the target, a solid-state camera to detect the return from the target, and image capture electronics and a digital signal processor to convert the video information into the relative positions and attitudes. The AVGS will fly as part of the Demonstration of Autonomous Rendezvous Technologies (DART) in October, 2004. This development effort has required a great deal of testing of various sorts at every phase of development. Some of the test efforts included optical characterization of performance with the intended target, thermal vacuum testing, performance tests in long range vacuum facilities, EMI/EMC tests, and performance testing in dynamic situations. The sensor has been shown to track a target at ranges of up to 300 meters, both in vacuum and ambient conditions, to survive and operate during the thermal vacuum cycling specific to the DART mission, to handle EMI well, and to perform well in dynamic situations.

Paper Details

Date Published: 1 September 2004
PDF: 11 pages
Proc. SPIE 5418, Spaceborne Sensors, (1 September 2004); doi: 10.1117/12.542475
Show Author Affiliations
Richard T. Howard, NASA Marshall Space Flight Ctr. (United States)
Albert S. Johnston, NASA Marshall Space Flight Ctr. (United States)
Thomas C. Bryan, NASA Marshall Space Flight Ctr. (United States)
Michael L. Book, NASA Marshall Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 5418:
Spaceborne Sensors
Robert D. Habbit Jr.; Peter Tchoryk Jr., Editor(s)

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