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Proceedings Paper

XML-based resources for simulation
Author(s): Robert L. Kelsey; Jane M. Riese; Ginger A. Young
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Paper Abstract

As simulations and the machines they run on become larger and more complex the inputs and outputs become more unwieldy. Increased complexity makes the setup of simulation problems difficult. It also contributes to the burden of handling and analyzing large amounts of output results. Another problem is that among a class of simulation codes (such as those for physical system simulation) there is often no single standard format or resource for input data. To run the same problem on different simulations requires a different setup for each simulation code. The eXtensible Markup Language (XML) is used to represent a general set of data resources including physical system problems, materials, and test results. These resources provide a "plug and play" approach to simulation setup. For example, a particular material for a physical system can be selected from a material database. The XML-based representation of the selected material is then converted to the native format of the simulation being run and plugged into the simulation input file. In this manner a user can quickly and more easily put together a simulation setup. In the case of output data, an XML approach to regression testing includes tests and test results with XML-based representations. This facilitates the ability to query for specific tests and make comparisons between results. Also, output results can easily be converted to other formats for publishing online or on paper.

Paper Details

Date Published: 13 August 2004
PDF: 8 pages
Proc. SPIE 5423, Enabling Technologies for Simulation Science VIII, (13 August 2004); doi: 10.1117/12.541441
Show Author Affiliations
Robert L. Kelsey, Los Alamos National Lab. (United States)
Jane M. Riese, Los Alamos National Lab. (United States)
Ginger A. Young, Los Alamos National Lab. (United States)

Published in SPIE Proceedings Vol. 5423:
Enabling Technologies for Simulation Science VIII
Dawn A. Trevisani; Alex F. Sisti, Editor(s)

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