
Proceedings Paper
Compact broadly tunable UV OPO for trace detection using REMPI mass spectrometryFormat | Member Price | Non-Member Price |
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Paper Abstract
A compact tunable UV OPO laser system has been used for the real-time detection of aromatic hydrocarbon hazardous air pollution vapors at sub-ppb levels using the jet-REMPI (jet-cooled Resonance Enhanced Multi-Photon Ionization) technique. By combining spectral and molecular mass detection, this technique provides high chemical selectivity, allowing species identification even during direct sampling of complex real-world samples. The inherent sensitivity of the jet-REMPI also allows direct real-time detection of trace species without pre-concentration. However, applications of the technique have been confined to the laboratory, requiring a complex and delicate tunable UV laser source and mass spectrometer. The results of applying a less complex, compact low-resolution OPO laser system are presented, with the goal of furthering the development a complete compact jet-REMPI instrument.
Paper Details
Date Published: 8 July 2004
PDF: 12 pages
Proc. SPIE 5332, Solid State Lasers XIII: Technology and Devices, (8 July 2004); doi: 10.1117/12.538418
Published in SPIE Proceedings Vol. 5332:
Solid State Lasers XIII: Technology and Devices
Richard Scheps; Hanna J. Hoffman, Editor(s)
PDF: 12 pages
Proc. SPIE 5332, Solid State Lasers XIII: Technology and Devices, (8 July 2004); doi: 10.1117/12.538418
Show Author Affiliations
Rhett James Barnes, OPOTEK, Inc. (United States)
Eli Margalith, OPOTEK, Inc. (United States)
Harald Oser, SRI International (United States)
Eli Margalith, OPOTEK, Inc. (United States)
Harald Oser, SRI International (United States)
Michael J. Coggiola, SRI International (United States)
Steven E. Young, SRI International (United States)
David R. Crosley, SRI International (United States)
Steven E. Young, SRI International (United States)
David R. Crosley, SRI International (United States)
Published in SPIE Proceedings Vol. 5332:
Solid State Lasers XIII: Technology and Devices
Richard Scheps; Hanna J. Hoffman, Editor(s)
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