
Proceedings Paper
Long-wavelength VCSELs with InP/air-gap DBRsFormat | Member Price | Non-Member Price |
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Paper Abstract
We demonstrate novel electrically pumped 1300 nm and 1550 nm VCSELs with two InP/air-gap DBRs. The active
regions comprise conventional InGaAsP multiple quantum wells. A tunnel junction is placed between the active region
and top DBR to convert electrons into holes, thus minimizing the use of p-type material in the structure to reduce the
free-carrier loss and achieve current confinement. The whole structure was grown in a single growth run by low
pressure MOCVD. For both 1300 and 1550 nm emission wavelengths, air-gap DBR VCSELs exhibit roomtemperature,
CW threshold current density as low as 1.1 kA/cm2, differential quantum efficiency greater than 30%, and
CW operation up to 85°C. The single-mode output power was 1.6 mW from a 1300 nm VCSEL with a 6.3 μm
aperture; and 1.1 mW from a 1550 nm VCSEL with a 5.7 μm aperture under room temperature CW operation
Paper Details
Date Published: 16 June 2004
PDF: 9 pages
Proc. SPIE 5364, Vertical-Cavity Surface-Emitting Lasers VIII, (16 June 2004); doi: 10.1117/12.538327
Published in SPIE Proceedings Vol. 5364:
Vertical-Cavity Surface-Emitting Lasers VIII
Chun Lei; Kent D. Choquette; Sean P. Kilcoyne, Editor(s)
PDF: 9 pages
Proc. SPIE 5364, Vertical-Cavity Surface-Emitting Lasers VIII, (16 June 2004); doi: 10.1117/12.538327
Show Author Affiliations
Chao-Kun Lin, Agilent Technologies, Inc. (United States)
David P. Bour, Agilent Technologies, Inc. (United States)
Jintian Zhu, Agilent Technologies, Inc. (United States)
William H. Perez, Agilent Technologies, Inc. (United States)
David P. Bour, Agilent Technologies, Inc. (United States)
Jintian Zhu, Agilent Technologies, Inc. (United States)
William H. Perez, Agilent Technologies, Inc. (United States)
Michael H. Leary, Agilent Technologies, Inc. (United States)
Ashish Tandon, Agilent Technologies, Inc. (United States)
Scott W. Corzine, Agilent Technologies, Inc. (United States)
Michael R. T. Tan, Agilent Technologies, Inc. (United States)
Ashish Tandon, Agilent Technologies, Inc. (United States)
Scott W. Corzine, Agilent Technologies, Inc. (United States)
Michael R. T. Tan, Agilent Technologies, Inc. (United States)
Published in SPIE Proceedings Vol. 5364:
Vertical-Cavity Surface-Emitting Lasers VIII
Chun Lei; Kent D. Choquette; Sean P. Kilcoyne, Editor(s)
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