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Proceedings Paper

Laser-micromachined defect arrays for DC potential drop fatigue studies
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Paper Abstract

The experimental characterization of fatigue crack initiation and growth of structural materials can be very expensive and time consuming. Fatigue specimens are typically controlled by a single dominant defect and several specimens are needed to examine the fatigue response for each loading condition of interest. Time and expense add up as millions of load cycles are sometimes required to initiate a crack, and replicate tests are necessary to characterize the inherent statistical nature of fatigue. In order to improve the efficiency of experimentation, we are developing laser-based techniques to produce fatigue test samples with arrays of defects. Controlled arrays of oval shaped micro-defects are laser-micromachined in titanium alloy (Ti-6Al-4V). Crack initiation from the individual defects in the arrays is monitored using a DC potential drop technique. Results indicate the utility of this approach in multiplying the amount of fatigue data generated per specimen-test. The new fatigue test approach is applicable to a wide range of material systems and initial defect structures.

Paper Details

Date Published: 15 July 2004
PDF: 6 pages
Proc. SPIE 5339, Photon Processing in Microelectronics and Photonics III, (15 July 2004); doi: 10.1117/12.537794
Show Author Affiliations
Craig B. Arnold, Princeton Univ. (United States)
Bhanu Pratap, Naval Research Lab. (United States)
Alberto Pique, Naval Research Lab. (United States)
Andrew B. Geltmacher, Naval Research Lab. (United States)
James P. Thomas, Naval Research Lab. (United States)

Published in SPIE Proceedings Vol. 5339:
Photon Processing in Microelectronics and Photonics III
Jan J. Dubowski; Peter R. Herman; Friedrich G. Bachmann; Willem Hoving; Jim Fieret; David B. Geohegan; Frank Träger; Kunihiko Washio; Alberto Pique; Xianfan Xu; Tatsuo Okada, Editor(s)

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