Proceedings Paper
New advanced lithography tools with mix-and-match strategy| Format | Member Price | Non-Member Price |
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Paper Abstract
Nikon has developed cutting-edge lithography tools, and its product lineup encompasses all exposure wavelengths. They are: the NSR-S307E ArF scanner for the 90nm node; the NSR-S207D KrF scanner for the 110nm node; the NSR-SF130 i-line stepper for the middle layer and the new concept NSR-SF200 KrF stepper, which offers unparalleled productivity and cost performance. In addition, a powerful support system is provided, the Lithography Equipment Engineering System, which will allow its customers to use all of these exposure tools simultaneously and derive the maximum benefit of the mix-and-match strategy. The use of this system will increase the uptime and enable their combined performance to exceed that of a stand-alone tool.Latest actual performance data from each of the tools and the result of the optimization performed using application software will be reported.
Paper Details
Date Published: 28 May 2004
PDF: 8 pages
Proc. SPIE 5377, Optical Microlithography XVII, (28 May 2004); doi: 10.1117/12.537214
Published in SPIE Proceedings Vol. 5377:
Optical Microlithography XVII
Bruce W. Smith, Editor(s)
PDF: 8 pages
Proc. SPIE 5377, Optical Microlithography XVII, (28 May 2004); doi: 10.1117/12.537214
Show Author Affiliations
Jun Ishikawa, Nikon Corp. (Japan)
Masahiro Nei, Nikon Corp. (Japan)
Masato Hamatani, Nikon Corp. (Japan)
Masahiro Nei, Nikon Corp. (Japan)
Masato Hamatani, Nikon Corp. (Japan)
Published in SPIE Proceedings Vol. 5377:
Optical Microlithography XVII
Bruce W. Smith, Editor(s)
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