
Proceedings Paper
PbO as direct conversion x-ray detector materialFormat | Member Price | Non-Member Price |
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Paper Abstract
A flat X-ray detector with lead oxide (PbO) as direct conversion material has been developed. The material lead oxide, which has a very high X-ray absorption, was analysed in detail including Raman spectroscopy and electron microscopy. X-ray performance data such as dark current, charge yield and temporal behaviour were evaluated on small functional samples. A process to cover a-Si TFT-plates with PbO has been developed. We present imaging results from a large
detector with an active area of 18 × 20 cm2. The detector has 1080 × 960 pixels with a pixel pitch of 184 μm. The linearity of detector response was verified. The NPS was determined with a total dark noise as low as 1800 electrons/pixel. The MTF was measured with two different methods: first with the analysis of a square wave phantom and second with a narrow slit. The MTF at the Nyquist frequency of 2.72 lp/mm was 50 %. We calculated first DQE values of our prototype detector plates. Full size images of anatomic and technical phantoms are shown.
Paper Details
Date Published: 6 May 2004
PDF: 12 pages
Proc. SPIE 5368, Medical Imaging 2004: Physics of Medical Imaging, (6 May 2004); doi: 10.1117/12.533010
Published in SPIE Proceedings Vol. 5368:
Medical Imaging 2004: Physics of Medical Imaging
Martin J. Yaffe; Michael J. Flynn, Editor(s)
PDF: 12 pages
Proc. SPIE 5368, Medical Imaging 2004: Physics of Medical Imaging, (6 May 2004); doi: 10.1117/12.533010
Show Author Affiliations
Matthias Simon, Philips Research Labs. (Germany)
Ronald A. Ford, Philips Research Labs. (United Kingdom)
Anthony R. Franklin, Philips Research Labs. (United Kingdom)
Stefan P. Grabowski, Philips Research Labs. (Germany)
Bernd Menser, Philips Research Labs. (Germany)
Ronald A. Ford, Philips Research Labs. (United Kingdom)
Anthony R. Franklin, Philips Research Labs. (United Kingdom)
Stefan P. Grabowski, Philips Research Labs. (Germany)
Bernd Menser, Philips Research Labs. (Germany)
Gerd Much, Philips Research Labs. (Germany)
Augusto Nascetti, Philips Research Labs. (Germany)
Michael Overdick, Philips Research Labs. (Germany)
Martin John Powell, Philips Research Labs. (United Kingdom)
Detlef U. Wiechert, Philips Research Labs. (Germany)
Augusto Nascetti, Philips Research Labs. (Germany)
Michael Overdick, Philips Research Labs. (Germany)
Martin John Powell, Philips Research Labs. (United Kingdom)
Detlef U. Wiechert, Philips Research Labs. (Germany)
Published in SPIE Proceedings Vol. 5368:
Medical Imaging 2004: Physics of Medical Imaging
Martin J. Yaffe; Michael J. Flynn, Editor(s)
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