Share Email Print

Proceedings Paper

Quaternary InAlGaN-based deep-UV LED with high-Al-content p-type AlGaN
Author(s): Hideki Hirayama; Yoshinobu Aoyagi
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

For the realization of 250-350 nm band deep ultraviolet (UV) emitters using group III-nitride materials, it is required to obtain high-efficiency UV emission and hole conductivity for wide-bandgap (In)AlGaN. For achieving high-efficiency deep UV emission, it is quite effective to use In segregation effect which has been already used for InGaN blue emitting devices. We have demonstrated high-efficiency UV emission by introducing several percent of In into AlGaN in the wavelength range of 300-360 nm at room temperature with an In segregation effect. The emission fluctuation in the submicron region due to In segregation was clearly observed for the quaternary InAlGaN epitaxial layers. An internal quantum efficiency as high as 15% was estimated from quaternary InAlGaN based single quantum well (SQW) at around 350 nm at room temperature. Such a high efficiency UV emission can be obtained even on high threading dislocation density buffers. Also, hole conductivity was obtained for high Al content (>53%) Mg-doped AlGaN by using alternative gas flow growth process in metal-organic vapor phase epitaxy (MOVPE). Using these techniques we fabricated 310 nm band deep UV light-emitting diodes (LEDs) with quaternary InxAlyGa1-x-yN active region. We achieved output power of 0.4 mW for a 308 nm LED and 0.8 mW for a 314 nm LED under room temperature pulsed operation.

Paper Details

Date Published: 6 July 2004
PDF: 12 pages
Proc. SPIE 5359, Quantum Sensing and Nanophotonic Devices, (6 July 2004); doi: 10.1117/12.528091
Show Author Affiliations
Hideki Hirayama, RIKEN--The Institute of Physical and Chemical Research (Japan)
Yoshinobu Aoyagi, Tokyo Institute of Technology (Japan)

Published in SPIE Proceedings Vol. 5359:
Quantum Sensing and Nanophotonic Devices
Manijeh Razeghi; Gail J. Brown, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?