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Proceedings Paper

Area-mura detection in TFT-LCD panel
Author(s): Kyu N. Choi; Jae Y. Lee; Suk I. Yoo
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Paper Abstract

TFT-LCD generally has the intrinsic non-uniformity due to the variance of the backlight. The region that has the perceptible non-uniformity is defined as a defect, called area-mura. In this paper, we present a new segmentation method for detecting area-mura. We first extract candidates of area-muras using regression diagnostics and then select the real area-muras among those candidates based on the size and SEMU index, a measure of contrast based on human brightness perception. Performance of the presented method has been evaluated on those TFT-LCD panel samples provided by Samsung Electronics Co., Ltd.

Paper Details

Date Published: 19 April 2004
PDF: 8 pages
Proc. SPIE 5300, Vision Geometry XII, (19 April 2004); doi: 10.1117/12.525557
Show Author Affiliations
Kyu N. Choi, Seoul National Univ. (South Korea)
Jae Y. Lee, Seoul National Univ. (South Korea)
Suk I. Yoo, Seoul National Univ. (South Korea)

Published in SPIE Proceedings Vol. 5300:
Vision Geometry XII
Longin Jan Latecki; David M. Mount; Angela Y. Wu, Editor(s)

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