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Proceedings Paper

Entangled-photon ellipsometry
Author(s): Alexander V. Sergienko; Ayman F. Abouraddy; Kimani C. Toussaint Jr.; Bahaa E. A. Saleh; Malvin C. Teich
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Paper Abstract

We present a novel quantum interferometric technique to perform ellipsometric measurements. Classical ellipsometric measurements are limited in their accuracy by virtue of the need for an absolutely calibrated source and detector. Mitigating this limitation requires the use of a well-characterized reference sample. Our technique relies on the use of a non-classical optical source, namely polarization-entangled twin photons generated by spontaneous parametric down-conversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. We have demonstrated that entangled-photon ellipsometry eliminates the necessity of constructing an interferometer altogether and is thereby self-referencing. The underlying physics that leads to this remarkable result is the presence of fourth-order (coincidence) quantum interference of the photon pairs in conjuction with polarization entanglement.

Paper Details

Date Published: 19 November 2003
PDF: 2 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.524615
Show Author Affiliations
Alexander V. Sergienko, Boston Univ. (United States)
Ayman F. Abouraddy, Boston Univ. (United States)
Kimani C. Toussaint Jr., Boston Univ. (United States)
Bahaa E. A. Saleh, Boston Univ. (United States)
Malvin C. Teich, Boston Univ. (United States)

Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Giancarlo C. Righini; Anna Consortini, Editor(s)

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