Share Email Print

Proceedings Paper

New histogram-based BIST scheme for on-board ADC
Author(s): Yunan Hu; Liang Wu
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A Histogram-based On-Board ADC BIST method is presented in this paper. Compared with the classical Histogram test, this scheme reduces the BIST hardware cost greatly, because the difficulty of nonlinearity computation is reduced in our scheme. Instead, we set a threshold to justify the nonlinearity of the ADC under test.

Paper Details

Date Published: 2 September 2003
PDF: 4 pages
Proc. SPIE 5253, Fifth International Symposium on Instrumentation and Control Technology, (2 September 2003); doi: 10.1117/12.522325
Show Author Affiliations
Yunan Hu, Naval Aeronautical Engineering Academy (China)
Liang Wu, Naval Aeronautical Engineering Academy (China)

Published in SPIE Proceedings Vol. 5253:
Fifth International Symposium on Instrumentation and Control Technology
Guangjun Zhang; Huijie Zhao; Zhongyu Wang, Editor(s)

© SPIE. Terms of Use
Back to Top