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Proceedings Paper

Total area strain mapping improves total quality of stampings
Author(s): Timothy Schmidt; John Tyson; Konstantin Galanulis
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Paper Abstract

Sheet metal manufacturers are under constant and increasing pressure to improve and document quality, while reducing cost. Furthermore, OEMs are shifting responsibility for quality inspections to suppliers, adding extra burdens. Exciting, shapely product designs are placing greater demands on both quality assurance and development departments. Deep drawing and other new advanced forming methods push materials to their limits. There is a new stamping quality control tool available for easy, effective and reliable determination of shape, strains and thinning. Full-field optical vision systems, based on the well-known principles of circle grid analysis and photogrammetry, provide automated analysis and quantitative color maps for every square inch of complex parts. Quality results are displayed on a 3D computer model, using the actual measured dimensions of the real part, allowing it to be viewed from any angle. One of the key features of this system is a dynamic link between the forming limit diagram and the strain/thinning color map. When a point is clicked on either display, a second crosshair automatically highlights that same point on the other display, and a detail box presents all measured and calculated quantities. Critical points can be identified at a glance so that corrective action can be taken. Examples shown include before and after die optimization, and analysis of a 1.2 meter long B-pillar stamping.

Paper Details

Date Published: 26 February 2004
PDF: 6 pages
Proc. SPIE 5265, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology, (26 February 2004); doi: 10.1117/12.519291
Show Author Affiliations
Timothy Schmidt, Trilion Quality Systems (United States)
John Tyson, Trilion Quality Systems (United States)
Konstantin Galanulis, GOM mbH (Germany)

Published in SPIE Proceedings Vol. 5265:
Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology
Bruce G. Batchelor; Heinz Hugli, Editor(s)

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