
Proceedings Paper
Hyperspectral imagery vegetation index and temporal analysis for corn yield estimationFormat | Member Price | Non-Member Price |
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Paper Abstract
Aerial hyperspectral imagery has been used to find the temporal relationship between image and corn yield. A total of
five hyperspectral images were taken during the growing season. For each image, the optimal vegetation index was
selected among many candidate vegetation indices. At the same time, the optimal band subset was selected to calculate
the vegetation index. The optimal band subset has the minimum number of bands and represents the most significant
image bands (or wavelength) for yield prediction. The optimization process used the EAVI (Evolutionary Algorithm
based Vegetation Index generation) algorithm. Results showed that the EAVI algorithm generated the best vegetation
index among many comparison indices for yield estimation. For image taken at different date, the algorithm selected a
different optimal vegetation index and image bands. The most common sensitive wavelength identified was in the red
edge at 700 nm and in the NIR region at 826 nm. This study showed that images taken from the beginning of full canopy
coverage to the corn ear formation period provided the best and stable result for corn yield estimation. It is suggested
that this period of time during the growing season would have great potential for remote sensing based corn yield
prediction.
Paper Details
Date Published: 30 March 2004
PDF: 11 pages
Proc. SPIE 5271, Monitoring Food Safety, Agriculture, and Plant Health, (30 March 2004); doi: 10.1117/12.518803
Published in SPIE Proceedings Vol. 5271:
Monitoring Food Safety, Agriculture, and Plant Health
George E. Meyer; Yud-Ren Chen; Shu-I Tu; Bent S. Bennedsen; Andre G. Senecal, Editor(s)
PDF: 11 pages
Proc. SPIE 5271, Monitoring Food Safety, Agriculture, and Plant Health, (30 March 2004); doi: 10.1117/12.518803
Show Author Affiliations
Haibo Yao, Univ. of Illinois/Urbana-Champaign (United States)
Lei Tian, Univ. of Illinois/Urbana-Champaign (United States)
Published in SPIE Proceedings Vol. 5271:
Monitoring Food Safety, Agriculture, and Plant Health
George E. Meyer; Yud-Ren Chen; Shu-I Tu; Bent S. Bennedsen; Andre G. Senecal, Editor(s)
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