Share Email Print

Proceedings Paper

Changes in the temperature dependence of the dielectric constant in irradiated antiferroelectric thin films
Author(s): Dmitry A. Lesnyh; Dmitry V. Kulikov; Yuri V. Trushin; Roland Bittner; Karl Humer; Harald W. Weber; Andris R. Sternberg
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A model describing the changes of the Curie-Weiss temperature in lead-zirconate thin films under neutron irradiation is proposed. The Curie-Weiss temperature in the irradiated material decreases which is connected to charges caused by neutron irradiation. The charges located near the surfaces due to Schottky effect and in the bulk of the film results in different rates of the Curie-Weiss temperature decreases with neutron fluence. However the influence of the Schottky layers seems to be more pronounced. Satisfactory agreement between the theoretical results and the experimental data is obtained for different neutron fluences.

Paper Details

Date Published: 10 October 2003
PDF: 4 pages
Proc. SPIE 5127, Sixth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (10 October 2003); doi: 10.1117/12.517954
Show Author Affiliations
Dmitry A. Lesnyh, St. Petersburg State Technical Univ. (Russia)
Dmitry V. Kulikov, A.F. Ioffe Physico-Technical Institute (Russia)
Yuri V. Trushin, St. Petersburg State Technical Univ. (Russia)
A.F. Ioffe Physico-Technical Institute (Russia)
Roland Bittner, Atominstitut der Osterreichischen Universitäten (Austria)
Karl Humer, Atominstitut der Osterreichischen Universitäten (Austria)
Harald W. Weber, Atominstitut der Osterreichischen Universitäten (Austria)
Andris R. Sternberg, Univ. of Latvia (Latvia)

Published in SPIE Proceedings Vol. 5127:
Sixth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering
Alexander I. Melker, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?