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Proceedings Paper

Metallic and semiconducting nanowires: properties and architectures
Author(s): Donats Erts; Hakan Olin; Justin D. Holmes
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Paper Abstract

Nanowires are expected to play an important role in future electronic, optical devices and nanoelectromechanical devices. Measuring the electrical and mechanical properties of nanowires is however a difficult task due to their small dimensions. Here we report the use of an in-situ microscopy technique, which combines transmission electron microscopy (TEM) with scanning probe microscopy (SPM), to investigate the electrical and mechanical properties of metallic and semiconductor nanowires. Additionally, in this paper we describe a novel approach for synthesizing mesoporous silicas with tunable pore diameters, wall thickness and pore spacings that can be used as tempates for the assembly of semiconductor nanowire arrays. Silicon and germanium nanowires, with size monodisperse diameters, can readily be formed within the mesoporous silica matrix using a supercritical fluid inclusion technique. These nano-composite materials display unique optical properties such as intense room temperature ultraviolet and visible photoluminense. The implication of these mesoporous nanowire materials for future electronic and opto-electronic devices is discussed.

Paper Details

Date Published: 8 August 2003
PDF: 11 pages
Proc. SPIE 5123, Advanced Optical Devices, Technologies, and Medical Applications, (8 August 2003); doi: 10.1117/12.517030
Show Author Affiliations
Donats Erts, Univ. of Latvia (Latvia)
Hakan Olin, Chalmers Univ. of Technology (Sweden)
Justin D. Holmes, Univ. College Cork (Ireland)

Published in SPIE Proceedings Vol. 5123:
Advanced Optical Devices, Technologies, and Medical Applications
Janis Spigulis; Janis Teteris; Maris Ozolinsh; Andrejs Lusis, Editor(s)

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