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Proceedings Paper

Physical mechanism of photoemission from the Ag-O-Cs photocathodes and perspectives of its implementation for getting subfemtosecond-range temporal resolution
Author(s): Eduard L. Nolle; Mikhail Ya. Schelev; Alla N. Khokhlova
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Paper Abstract

Comprehensive studies upon the structure and physical properties of Ag-O-Cs photocathode with the AES and XPES techniques are presented. The photoelectron emission spectrum has been measured in situ on each stage of the photocathode preparation. Similar investigations have been carried out as to nanoparticles of Ag with size several tens of nanometers. Being activated with Cs and O, those particles are located on the thin sapphire film surface. It may be concluded that the photoemission from the Ag-O-Cs photocathodes has the same nature as the photoemission from the nanoparticles of Ag on sapphire, namely it is conditioned by the excitation of surface plasmons with concurrent emission of electrons. It also means that the nanoparticles of Ag activated with Cs and O and investigated in this paper may be conceived as a 2-dimensional photocathode. The external photoemission from Ag-O-Cs photocathodes is of strongly pronouned surface nature, with no process of transportation of electrons towards the surface. In this case the characteristic time during which a light wave is able of exciting plasmons at the nanoparticles of Ag is less than 1 fs, which makes the Ag-O-Cs photocathode most perspective from the viewpoint of getting limiting subfemtosecond-range time resolution.

Paper Details

Date Published: 1 August 2003
PDF: 7 pages
Proc. SPIE 4948, 25th International Congress on High-Speed Photography and Photonics, (1 August 2003); doi: 10.1117/12.516889
Show Author Affiliations
Eduard L. Nolle, General Physics Institute (Russia)
Mikhail Ya. Schelev, General Physics Institute (Russia)
Alla N. Khokhlova, General Physics Institute (Russia)

Published in SPIE Proceedings Vol. 4948:
25th International Congress on High-Speed Photography and Photonics
Claude Cavailler; Graham P. Haddleton; Manfred Hugenschmidt, Editor(s)

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