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Proceedings Paper

A decade of innovation with laser speckle metrology
Author(s): Andreas Ettemeyer
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Paper Abstract

Speckle Pattern Interferometry has emerged from the experimental substitution of holographic interferometry to become a powerful problem solving tool in research and industry. The rapid development of computer and digital imaging techniques in combination with minaturization of the optical equipment led to new applications which had not been anticipated before. While classical holographic interferometry had always required careful consideration of the environmental conditions such as vibration, noise, light, etc. and could generally only be performed in the optical laboratory, it is now state of the art, to handle portable speckle measuring equipment at almost any place. During the last decade, the change in design and technique has dramatically influenced the range of applications of speckle metrology and opened new markets. The integration of recent research results into speckle measuring equipment has led to handy equipment, simplified the operation and created high quality data output.

Paper Details

Date Published: 27 May 2003
PDF: 7 pages
Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); doi: 10.1117/12.516643
Show Author Affiliations
Andreas Ettemeyer, Ettemeyer AG (Germany)

Published in SPIE Proceedings Vol. 4933:
Speckle Metrology 2003
Kay Gastinger; Ole Johan Lokberg; Svein Winther, Editor(s)

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