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Proceedings Paper

Detection of faults in interferometric fringe patterns by optical wavelet filtering
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Paper Abstract

In this paper the dynamic processing of interferometric fringe patterns obtained by real-time optical measurement methods like holographic interferometry is shown. A hologram of the tested component is superimposed with the hologram of the stressed component. The achieved fringe patterns vary according to the degree of stress applied. To evaluate these varying fringe patterns in real time, dynamic filtering is required. A hybrid opto-electronic sytem with a digital image processing and optical correlation module based on liquid-crystal spatial light modulators gives us the possibility to use dynamic filters and input images. In order to process interferometric fringes the adaptive wavelet transformation is applied.

Paper Details

Date Published: 27 May 2003
PDF: 8 pages
Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003);
Show Author Affiliations
Guenther K.G. Wernicke, Humboldt-Univ. zu Berlin (Germany)
Frank Kallmeyer, Humboldt-Univ. zu Berlin (Germany)
S. Krueger, Humboldt-Univ. zu Berlin (Germany)
Hartmut Gruber, Humboldt-Univ. zu Berlin (Germany)
Daniel Kayser, Bremer Institut fuer angewandte Strahltechnik (Germany)

Published in SPIE Proceedings Vol. 4933:
Speckle Metrology 2003
Kay Gastinger; Ole Johan Lokberg; Svein Winther, Editor(s)

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