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Proceedings Paper

Noise reduction in speckle pattern interferometer
Author(s): J. Kauffmann; Markus Gahr; Hans J. Tiziani
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Paper Abstract

In speckle pattern interferometry the starting phase is distributed randomly. Furthermore the background intensity and the modulation also are structured stochastically. This leads to a significant amount of noise in the interferogram analysis. Low modulated speckles are more difficult to evaluate than high modulated ones. We report on a method to reduce this problem. The principle is to use more than one wavelength at the same time and to separate the different wavelengths in the recording plane. With this method the precision can be improved by factor up to 2.3. Our first experiments show the high potential of this method.

Paper Details

Date Published: 27 May 2003
PDF: 6 pages
Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); doi: 10.1117/12.516568
Show Author Affiliations
J. Kauffmann, Institut fuer Technische Optik, Univ. Stuttgart (Germany)
Markus Gahr, Fachhochschule Aalen (Germany)
Hans J. Tiziani, Institut fuer Technische Optik, Univ. Stuttgart (Germany)

Published in SPIE Proceedings Vol. 4933:
Speckle Metrology 2003
Kay Gastinger; Ole Johan Lokberg; Svein Winther, Editor(s)

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