Share Email Print

Proceedings Paper

Pollution prevention applications in batch manufacturing operations
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Older, "low-tech" batch manufacturing operations are often fertile grounds for gains resulting from pollution prevention techniques. This paper presents a pollution prevention technique utilized for wastewater discharge permit compliance purposes at a batch manufacturer of detergents, deodorants, and floor-care products. This manufacturer generated industrial wastewater as a result of equipment rinses required after each product batch changeover. After investing a significant amount of capital on end of pip-line wastewater treatment technology designed to address existing discharge limits, this manufacturer chose to investigate alternate, low-cost approaches to address anticipated new permit limits. Mass balances using spreadsheets and readily available formulation and production data were conducted on over 300 products to determine how each individual product contributed to the total wastewater pollutant load. These mass balances indicated that 22 products accounted for over 55% of the wastewater pollutant. Laboratory tests were conducted to determine whether these same products could accept their individual changeover rinse water as make-up water in formulations without sacrificing product quality. This changeover reuse technique was then implement at the plant scale for selected products. Significant reductions in wastewater volume (25%) and wastewater pollutant loading (85+%) were realized as a direct result of this approach.

Paper Details

Date Published: 27 February 2004
PDF: 9 pages
Proc. SPIE 5262, Environmentally Conscious Manufacturing III, (27 February 2004); doi: 10.1117/12.516187
Show Author Affiliations
Derek W. Sykes, Capaccio Environmental Engineering, Inc. (United States)
James O'Shaughnessy, Worcester Polytechnic Institute (United States)

Published in SPIE Proceedings Vol. 5262:
Environmentally Conscious Manufacturing III
Surendra M. Gupta, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?