Dielectric properties of epitaxial heterostructures of perovskite relaxor ferroelectric (RFE) PbMg_1/3Nb_2/3O₃, PbSc_0.5Nb_0.5O₃, PbMg_1/3Nb_2/3O₃-PbTiO₃, and PbSc_0.5Nb_0.5O₃-PbTiO₃ thin films were studied as a function of frequency (10² - 10⁶ Hz), temperature (77 - 725 K), and amplitude of applied ac-field (10³ - 10⁶ V/m). The contribution of the film-electrode interfaces to the properties of the heterostructures was evaluated, and the true properties of the films were reconstructed and analyzed. In the films, all typical features of RFE were found to be essentially similar to those in single crystals. Glass-like behavior in the RFE films was indicated by the Vogel-Fulcher relationship, deviation from the Curie-Weiss behavior, temperature evolution of the local order parameter, temperature evolution of the relaxation-time spectrum, and the maxima in the third-order nonlinear and scaled third-order nonlinear dielectric permittivities below the temperature of the dielectric maximum.

Date Published: 8 August 2003
PDF: 9 pages
Proc. SPIE 5122, Advanced Organic and Inorganic Optical Materials, (8 August 2003); doi: 10.1117/12.515665

Published in SPIE Proceedings Vol. 5122:
Advanced Organic and Inorganic Optical Materials
Andris Krumins; Donats Millers; Inta Muzikante; Andris Sternbergs; Vismants Zauls, Editor(s)