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Proceedings Paper

Z-scan technique through beam dimension measurements
Author(s): G. Tsigaridas; M. Fakis; I. Polyzos; Peter Persephonis; V. Giannetas
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Paper Abstract

In the present work a modification of the well-known z-scan technique is presented. It is based on the direct measurement of the beam dimensions in the far field rather than the transmittance of the irradiance through an aperture. More specifically, the quantity measured in the case of a circular Gaussian incident beam is the beam radius in the far field, while in the more general case of an elliptic Gaussian beam the measured quantities are the lengths of the principal semiaxes of the beam. It is worth emphasizing that the latter case is more interesting in practice since even a very small misalignment of the resonator of an actual laser system can easily induce astigmatism to the beam. The measurements were performed through a CCD camera in connection with a laser beam profiler. The advantages of the proposed modification compared to the classic z-scan technique are the elimination of the sensitivity in beam pointing instability as well as the drastic reduction of the sensitivity in energy fluctuations. Furthermore, the application of the standard z-scan technique in the case of an elliptic Gaussian incident beam is extremely difficult. The technique has been tested using the standard nonlinear optical material CS2 as a sample.

Paper Details

Date Published: 9 April 2003
PDF: 5 pages
Proc. SPIE 5131, Third GR-I International Conference on New Laser Technologies and Applications, (9 April 2003); doi: 10.1117/12.513490
Show Author Affiliations
G. Tsigaridas, Univ. of Patras (Greece)
M. Fakis, Univ. of Patras (Greece)
I. Polyzos, Univ. of Patras (Greece)
Peter Persephonis, Univ. of Patras (Greece)
V. Giannetas, Univ. of Patras (Greece)

Published in SPIE Proceedings Vol. 5131:
Third GR-I International Conference on New Laser Technologies and Applications
Alexis Carabelas; Giuseppe Baldacchini; Paolo Di Lazzaro; Dimitrios Zevgolis, Editor(s)

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