Share Email Print
cover

Proceedings Paper

Comparison of flux-tracing-based and diffraction-based strategies for optical system evaluation
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We report the comparison between two methods to evaluate optical systems. The flux-tracing method is an extension of the classical ray-tracing methods with additional energetic features. The direct integration method involves the calculation of the integral appearing in the diffraction theory of aberrations. We give a brief outline of the two methods and compare the results on a standard optical system. This will help to put in common the two methods to try to formulate new algorithms for the design of optical systems.

Paper Details

Date Published: 18 February 2004
PDF: 8 pages
Proc. SPIE 5249, Optical Design and Engineering, (18 February 2004); doi: 10.1117/12.513367
Show Author Affiliations
Josep Arasa, Univ. Politecnica de Catalunya (Spain)
Salvador Bosch, Univ. de Barcelona (Spain)
Josep Ferre-Borrull, Univ. de Barcelona (Spain)
Carles Pizarro, Univ. Politecnica de Catalunya (Spain)


Published in SPIE Proceedings Vol. 5249:
Optical Design and Engineering
Laurent Mazuray; Philip J. Rogers; Rolf Wartmann, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray