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Proceedings Paper

Absolute testing of aspheric surfaces
Author(s): Stephan Reichelt; Christof Pruss; Hans J. Tiziani
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Paper Abstract

A complete absolute interferometric test of aspheres is presented. The method is based on a specially designed computer-generated hologram (CGH), which reconstructs an aspherical wave as well as auxiliary waves. The auxiliary waves are used for calibration. The aberrations of the auxiliary waves are measured absolutely by means of established absolute testing methods. The errors of the auxiliary waves can be transferred to those of the aspheric wave. Methods for absolute testing of aspheric surfaces using multiplex CGHs are described. Test procedures are explained and equations are derived. For axially symmetric aspheres, experimental results are presented and a comparison with the established N-position rotation test is given.

Paper Details

Date Published: 26 February 2004
PDF: 12 pages
Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology, (26 February 2004); doi: 10.1117/12.513364
Show Author Affiliations
Stephan Reichelt, Univ. Stuttgart (Germany)
Christof Pruss, Univ. Stuttgart (Germany)
Hans J. Tiziani, Univ. Stuttgart (Germany)

Published in SPIE Proceedings Vol. 5252:
Optical Fabrication, Testing, and Metrology
Roland Geyl; David Rimmer; Lingli Wang, Editor(s)

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