Share Email Print

Proceedings Paper

Application of photopolymer holographic gratings in electronic speckle pattern shearing interferometry
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Two optical set-ups for electronic speckle pattern shearing interferometry (ESPSI) using photopolymer diffractive optical elements are presented. Holographic gratings are recorded using an acrylamide based photopolymer material. Since the polymerisation process occurs during recording, the holograms are produced without any development or processing. In both ESPSI systems the photopolymer gratings are used to shear the image. In the first ESPSI system only one grating is used in combination with a sheet of ground glass. The distance between the grating and the ground glass can be used to control the amount of the shear. The sheared images on the ground glass are further imaged onto a CCD camera. In the second ESPSI system two gratings are used to shear the image. The gratings are placed between the object and an imaging lens in front of the CCD camera. The distance between the two gratings controls the size of the shear. The ESPSI system with two photopolymer holographic gratings is compact and suitable for industrial applications. Introducing photopolymer holographic gratings in ESPSI gives the advantage of using high aperture optical elements at relatively low price. Both of these interferometric systems are simple and flexible.

Paper Details

Date Published: 18 February 2004
PDF: 9 pages
Proc. SPIE 5249, Optical Design and Engineering, (18 February 2004); doi: 10.1117/12.512971
Show Author Affiliations
Emilia Mitkova Mihaylova, Dublin Institute of Technology (Ireland)
Izabela Naydenova, Dublin Institute of Technology (Ireland)
Hosam Sherif, Dublin Institute of Technology (Ireland)
Suzanne Martin, Dublin Institute of Technology (Ireland)
Vincent Toal, Dublin Institute of Technology (Ireland)

Published in SPIE Proceedings Vol. 5249:
Optical Design and Engineering
Laurent Mazuray; Philip J. Rogers; Rolf Wartmann, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?