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Proceedings Paper

Source follower noise limitations in CMOS active pixel sensors
Author(s): Keith M. Findlater; Jerome M. Vaillant; Donald J. Baxter; Christine Augier; Didier Herault; Robert K. Henderson; Jed Hurwitz; Lindsay A. Grant; Jean-Marc Volle
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Paper Abstract

CMOS imagers are commonly employing pinned photodiode pixels and true correlated double sampling to eliminate kTC noise and achieve low noise performance. Low noise performance also depends on optimisation of the readout circuitry. This paper investigates the effect of the pixel source follower transistor on the overall noise performance through several characterization methods. The characterization methods are described, and experimental results are detailed. It is shown that the source follower noise can be the limiting factor of the image sensor and requires optimisation.

Paper Details

Date Published: 19 February 2004
PDF: 9 pages
Proc. SPIE 5251, Detectors and Associated Signal Processing, (19 February 2004); doi: 10.1117/12.512969
Show Author Affiliations
Keith M. Findlater, STMicroelectronics (United Kingdom)
Jerome M. Vaillant, STMicroelectronics (France)
Donald J. Baxter, STMicroelectronics (United Kingdom)
Christine Augier, STMicroelectronics (France)
Didier Herault, STMicroelectronics (France)
Robert K. Henderson, STMicroelectronics (United Kingdom)
Jed Hurwitz, STMicroelectronics (United Kingdom)
Lindsay A. Grant, STMicroelectronics (United Kingdom)
Jean-Marc Volle, STMicroelectronics (France)

Published in SPIE Proceedings Vol. 5251:
Detectors and Associated Signal Processing
Jean-Pierre Chatard; Peter N. J. Dennis, Editor(s)

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