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Proceedings Paper

Transmission deflectometer for high-range lens slope measurement
Author(s): Lingli Wang; Arno Ras; Willem Potze; Peter van de Goor
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Paper Abstract

A new lens slope measurement system is developed and realized in the Philips CFT laboratory, which is named a transmission deflectometer. The slopes of two lenses are measured with this measurement system. A high measurement accuracy, 0.05 mrad, over a wide measurement range of ± 17° could be reached.

Paper Details

Date Published: 26 February 2004
PDF: 8 pages
Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology, (26 February 2004); doi: 10.1117/12.512937
Show Author Affiliations
Lingli Wang, Philips Lighting B.V. (Netherlands)
Arno Ras, Philips Ctr. for Industrial Technology (Netherlands)
Willem Potze, Philips Ctr. for Industrial Technology (Netherlands)
Peter van de Goor, Philips Ctr. for Industrial Technology (Netherlands)

Published in SPIE Proceedings Vol. 5252:
Optical Fabrication, Testing, and Metrology
Roland Geyl; David Rimmer; Lingli Wang, Editor(s)

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