
Proceedings Paper
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Paper Abstract
Angle-resolved light scattering (ARLS) was used to investigate the roughness of
coatings on glossy paper. Angular spectra were measured for laser light scattered
from several glossy paper samples and from uncoated paper. These spectra are compared
to those calculated using the Beckmann model of a random surface that is isotropic
and rough in two dimensions. Such a surface is characterized by its rms
roughness and autocorrelation function, which are determined from surface profiles
measured with a stylus instrument. There is very good agreement between the measured
and the computed ARLS spectra. The surfaces are too rough to produce a specular
beam large enough to provide an accurate value of the rms roughness, but ARLS
provides information about the coating roughness when the measured spectra are cornpared
to computed ones.
Paper Details
Date Published: 1 January 1991
PDF: 9 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51133
Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)
PDF: 9 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51133
Show Author Affiliations
Egon Marx, National Institute of Standards and Technology (United States)
Jun-Feng Song, National Institute of Standards and Technology (United States)
Jun-Feng Song, National Institute of Standards and Technology (United States)
Theodore V. Vorburger, National Institute of Standards and Technology (United States)
Thomas Robert Lettieri, National Institute of Standards and Technology (United States)
Thomas Robert Lettieri, National Institute of Standards and Technology (United States)
Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)
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