Share Email Print

Proceedings Paper

Advances in polarization metrology
Author(s): Russell A. Chipman
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Three new polarimeters are described which represent advances in polarization metrology capabilities. Two are at a new polarization laboratory started at the University of Arizona’s Optical Sciences Center, (1) a Fiber Optic Spectropolarimeter and (2) a High Speed Mueller Matrix Imaging Polarimeter. The third is a new visible Mueller Matrix Spectropolarimeter for optical component test from a startup company, Axometrics, which is useful for detailed characterization of optical components and thin films via spectra of diattenuation, retardance, and depolarization.

Paper Details

Date Published: 6 November 2003
PDF: 8 pages
Proc. SPIE 5174, Novel Optical Systems Design and Optimization VI, (6 November 2003); doi: 10.1117/12.511279
Show Author Affiliations
Russell A. Chipman, Optical Sciences Ctr./Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 5174:
Novel Optical Systems Design and Optimization VI
Jose M. Sasian; R. John Koshel; Paul K. Manhart, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?